FA engineers are expected to produce accurate results. Thus, there is no room for error when it comes to the data provided by instruments. Due to its data precision ...

AFM-based nanoelectrical modes are used in many different domains ranging from piezoelectric materials and semiconductors through to biology and energy research. There are modes available to define ...

What is Scanning Microwave Microscopy? Scanning microwave microscopy (SMM) is a powerful imaging technique that combines the principles of atomic force microscopy (AFM) and microwave technology to ...

Complex interrelated phenomena lead to battery failure, which is dependent on battery design, environment, chemistry, and true operation conditions. Therefore, studies at the component level are ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...