[Asia Economy Reporter Minwoo Lee] Shares of Javis, a specialist company in X-ray inspection equipment, are on the rise. The news that Javis has developed the world's first equipment to inspect ...

Partially defective, marginal die can still be functional enough to pass final electrical test. Some of these “walking wounded” chips get past final testing, but in the customer’s end product, under ...

MILPITAS, Calif., June 22, 2021 /PRNewswire/ -- Today, KLA Corporation (NASDAQ: KLAC) announced the launch of four new products for automotive chip manufacturing: the 8935 high productivity patterned ...

Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.

KLA has announced the launch of four new products for automotive chip manufacturing: the 8935 high productivity patterned wafer inspection system, the C205 broadband plasma patterned wafer inspection ...

“Our customers are highly motivated to continue to extend optical inline defect inspection beyond the 20nm node,” said Keith Wells, vice president and general manager of the Wafer Inspection (WIN) ...

MILPITAS, Calif., July 8, 2019 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced the 392x and 295x optical defect inspection systems and the eDR7380™ e-beam defect review system. The new ...

A leading tyre manufacturer has solved an inline inspection problem by using non-contact laser-based profile measurement sensors, which detect the slightest bulge, recess or other surface defect. A ...

HEIDELBERG, Germany — April 25, 2017 — The print media industry frequently faces demands for high quality in combination with ever shorter throughput times, complex products, or just-in-time ...