The JEDEC 35 Standard (EIA/JESD35, Procedure for Wafer-Level Testing of Thin Dielectrics) describes voltage ramp (V-ramp) and current ramp (J-ramp) tests to monitor oxide integrity. These tests are ...
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New Stealth J-36 and J-XDS Fighters Might Be Undergoing Testing at China’s ‘Area 51’
Key Points and Summary - New satellite imagery (Aug/Sept 2025) reveals China has moved its two 6th-generation stealth fighter prototypes, the "three-engine" J-36 and the "lambda-wing" J-XDS (or J-50), ...
Various videos captured by people on the ground show the J-36 making a turn, while others show a decent side and bottom view, with the landing gear still extended. The aircraft also has a flight data ...
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