When it comes to benchtop powder x-ray diffractometers, researchers may think of systems in which functionality is sacrificed in favor of conserving space and cost. Users may be left with the ...
With the development of different techniques for the synthesis of nanomaterials, researchers are constantly looking for a more precise instrument for their nanoscale characterization. X-ray ...
“X-ray diffraction imaging (XRDI) (topography) measurements of silicon die warpage within fully packaged commercial quad-flat no-lead devices are described. Using synchrotron radiation, it has been ...
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