In scanning electron microscopy, the deposition of electron beam induced hydrocarbon contamination is considered to be a persistent problem. Deposition of contamination on a sample is usually an ...
A Scanning Electron Microscope (SEM) is a powerful magnification tool that utilizes focused beams of electrons to obtain information. This surface imaging method is fully able to monitor size, size ...
The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...
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